TPD4EUSB30DQAR

Description
Quad 0.8-pF, 5.5-V, ±8-kV ESD protection diode with 5-A 8/20-uS surge rating for USB 3.0 10-USON -40 to 85
Datasheet
Texas Instruments TPD4EUSB30DQAR product image

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  • Quad-Channel ESD Protection Diode Array for USB 3.0 Data Lines
  • 0.8 pF Low Channel Capacitance to Preserve Super Speed Signal Integrity
  • Plus/Minus 8 kV ESD Protection with a 5 A 8/20 Us Surge rating, 5.5 V Rated
  • 10-Pin USON package, 2.5 Mm X 1.0 mm, 550 Um Height / 500 Um Thickness
  • -40 C to +85 C Operating Temperature Range
  • Lead free, RoHS compliant, No REACH SVHC; SMD/SMT Tape and Reel

The TPD4EUSB30DQAR is a Texas Instruments quad-channel ESD protection diode array intended for USB 3.0 signal lines, supplied in a 10-pin USON package. Per its TI part title it offers 0.8 pF channel capacitance, a 5.5 V rating, plus or minus 8 kV ESD protection and a 5 A 8/20 us surge rating. The TPD4EUSB30DQAR measures 2.5 mm x 1.0 mm with a 550 um height and 500 um thickness, making it suitable for space-constrained connector areas. It is lead free, RoHS compliant, free of REACH SVHC declarations, rated -40 C to +85 C, and shipped on tape and reel.

ESD protection arrays are placed directly at exposed connectors so that electrostatic discharge from cable insertion or human contact is clamped before it reaches the transceiver. The TPD4EUSB30DQAR is sized for USB 3.0 ports, where four lines must be protected without loading the high-speed differential pairs, which is why the 0.8 pF per-channel capacitance matters. Its very small 10-USON footprint lets designers place it close to the connector shell in phones, tablets, notebooks, docking stations, set-top boxes and industrial USB ports. Typical buyers are consumer, computing and industrial OEMs designing USB 3.0 host or device ports.

Fusion’s in-house quality hubs and Prosemi testing facility are fully certified to meet critical industry standards for electronic component inspection and testing.

AS6081
AS9120B
ISO 9001
QMS STD 9090

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